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書誌情報 | ファイル |
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Decoding the view expectation during learned maze navigation from human fronto-parietal network Shikauchi, Yumi; Ishii, Shin (2015-12-03) Scientific Reports, 5 | |
Statistical Timing Modeling Based on a Lognormal Distribution Model for Near-Threshold Circuit Optimization SHIOMI, Jun; ISHIHARA, Tohru; ONODERA, Hidetoshi (2015-07-01) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E98.A(7): 1455-1466 | |
Egocentric direction and position perceptions are dissociable based on only static lane edge information Nakashima, Ryoichi; Iwai, Ritsuko; Ueda, Sayako; Kumada, Takatsune (2015-01-01) Frontiers in Psychology, 6 | |
三次元画像に基づく臓器切離プロセスのモデリング 中尾, 恵; 田浦, 康二朗; 松田, 哲也 (2015-09) VR医学会学術大会抄録集(第15回大会), 15(suppl-1): 23-24 | |
Radiometric compensation for cooperative distributed multi-projection system through 2-DOF distributed control. Tsukamoto, Jun; Iwai, Daisuke; Kashima, Kenji (2015-11-15) IEEE transactions on visualization and computer graphics, 21(11): 1221-1229 | |
Simultaneous Perturbation Stochastic Approximation with Norm-Limited Update Vector Tanaka, Yosuke; Azuma, Shun-ichi; Sugie, Toshiharu (2015-11) Asian Journal of Control, 17(6): 2083-2090 | |
Identification of continuous-time Hammerstein systems by simultaneous perturbation stochastic approximation Ahmad, Mohd Ashraf; Azuma, Shun-ichi; Sugie, Toshiharu (2016-01) Expert Systems with Applications, 43: 51-58 | |
Semi-autonomous avatar enabling unconstrained parallel conversations --seamless hybrid of WOZ and autonomous dialogue systems-- Kawahara, Tatsuya; Muramatsu, Naoyuki; Yamamoto, Kenta; Lala, Divesh; Inoue, Koji (2021) Advanced Robotics, 35(11): 657-663 | |
A Forward/Reverse Body Bias Generator with Wide Supply-Range down to Threshold Voltage KAMAE, Norihiro; TSUCHIYA, Akira; ONODERA, Hidetoshi (2015) IEICE Transactions on Electronics, E98.C(6): 504-511 | |
Adaptive Virtual Metrology Design for Semiconductor Dry Etching Process Through Locally Weighted Partial Least Squares Hirai, Toshiya; Kano, Manabu (2015-05) IEEE Transactions on Semiconductor Manufacturing, 28(2): 137-144 |