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| 書誌情報 | ファイル |
|---|---|
| Fast estimation of NBTI-induced delay degradation based on signal probability Bian, Song; Shintani, Michihiro; Hiromoto, Masayuki; Sato, Takashi (2016-07-01) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E99.A: 1400-1409 |  |
| Efficient aging-aware SRAM failure probability calculation via particle filter-based importance sampling Awano, Hiromitsu; Hiromoto, Masayuki; Sato, Takashi (2016-07-01) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E99.A: 1390-1399 | |
| Efficient Aging-aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation AWANO, Hiromitsu; SATO, Takashi (2017) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E100-A(12): 2807-2815 | |
| Identification and Application of Invariant Critical Paths under NBTI Degradation BIAN, Song; MORITA, Shumpei; SHINTANI, Michihiro; AWANO, Hiromitsu; HIROMOTO, Masayuki; SATO, Takashi (2017-12) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E100.A(12): 2797-2806 | |