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書誌情報ファイル
Midgap levels in both n- and p-type 4H-SiC epilayers investigated by deep level transient spectroscopy
  Danno, K; Kimoto, T; Matsunami, H (2005-03-21)
  Applied Physics Letters, 86(12)
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Design and Fabrication of RESURF MOSFETs on 4H-SiC(0001), (1120), and 6H-SiC(0001)
  Kimoto, T; Kosugi, H; Suda, J; Kanzaki, Y; Matsunami, H (2005)
  IEEE TRANSACTIONS ON ELECTRON DEVICES, 52(1): 112-117
Short-Channel Effects in 4H-SiC MOSFETs
  Noborio, M; Kanzaki, Y; Suda, J; Kimoto, T; Matsunami, H (2005)
  SILICON CARBIDE AND RELATED MATERIALS 2004, 483: 821-824
Selective embedded growth of 4H-SiC trenches in 4H-SiC(0001) substrates using carbon mask
  Chen, Y; Kimoto, T; Takeuchi, Y; Malhan, RK; Matsunami, H (2005)
  JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 44(7A): 4909-4910
Characterization of in-grown stacking faults in 4H-SiC (0001) epitaxial layers and its impacts on high-voltage Schottky barrier diodes
  Fujiwara, H; Kimoto, T; Tojo, T; Matsunami, H (2005)
  APPLIED PHYSICS LETTERS, 87(5)
Effects of C/Si ratio in fast epitaxial growth of 4H-SIC(0001) by vertical hot-wall chemical vapor deposition
  Fujiwara, H; Danno, K; Kimoto, T; Tojo, T; Matsunami, H (2005)
  JOURNAL OF CRYSTAL GROWTH, 281(2-4): 370-376
Fast epitaxial growth of high-purity 4H-SiC(000(1)over-bar) in a vertical hot-wall chemical vapor deposition
  Danno, K; Kimoto, T; Asano, K; Sugawara, Y; Matsunami, H (2005)
  JOURNAL OF ELECTRONIC MATERIALS, 34(4): 324-329
Experimental and theoretical investigations on short-channel effects in 4H-SiC MOSFETs
  Noborio, M; Kanzaki, Y; Suda, J; Kimoto, T (2005)
  IEEE TRANSACTIONS ON ELECTRON DEVICES, 52(9): 1954-1962
Dose designing for high-voltage 4H-SiC RESURF MOSFETs - device simulation and fabrication
  Kawano, H; Kimoto, T; Suda, J; Matsunami, H (2005)
  SILICON CARBIDE AND RELATED MATERIALS 2004, 483: 809-812
Mechanism of stabilization of zincblende GaN on hexagonal substrates: Insight gained from growth on ZrB2(0001)
  Armitage, R; Nishizono, K; Suda, J; Kimoto, T (2005)
  JOURNAL OF CRYSTAL GROWTH, 284(3-4): 369-378