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| 書誌情報 | ファイル |
|---|---|
| Device-Parameter Estimation through IDDQ Signatures SHINTANI, Michihiro; SATO, Takashi (2013-02) IEICE Transactions on Information and Systems, E96.D(2): 303-313 |  |
| A Variability-Aware Energy-Minimization Strategy for Subthreshold Circuits KAWASHIMA, Junya; TSUTSUI, Hiroshi; OCHI, Hiroyuki; SATO, Takashi (2012-12) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E95.A(12): 2242-2250 | |
| State-Dependence of On-Chip Power Distribution Network Capacitance YAMANAGA, Koh; HAGIWARA, Shiho; TAKAHASHI, Ryo; MASU, Kazuya; SATO, Takashi (2014-01) IEICE Transactions on Electronics, E97.C(1): 77-84 | |
| Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation MORITA, Shumpei; BIAN, Song; SHINTANI, Michihiro; HIROMOTO, Masayuki; SATO, Takashi (2017-07-01) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E100.A(7): 1464-1472 | |
| Efficient Aging-aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation AWANO, Hiromitsu; SATO, Takashi (2017) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E100-A(12): 2807-2815 | |
| Identification and Application of Invariant Critical Paths under NBTI Degradation BIAN, Song; MORITA, Shumpei; SHINTANI, Michihiro; AWANO, Hiromitsu; HIROMOTO, Masayuki; SATO, Takashi (2017-12) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E100.A(12): 2797-2806 | |