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書誌情報	ファイル
N2O-grown oxides/4H-SiC (0001), (0338), and (1120) interface properties characterized by using p-type gate-controlled diodes Noborio, Masato; Suda, Jun; Kimoto, Tsunenobu (2008) APPLIED PHYSICS LETTERS, 93(19)
The temperature dependence of the refractive indices of GaN and AlN from room temperature up to 515 degrees C Watanabe, Naoki; Kimoto, Tsunenobu; Suda, Jun (2008) JOURNAL OF APPLIED PHYSICS, 104(10)
Effects of Counteranions and Dissolved Oxygen on Chemical ZnO Deposition from Aqueous Solutions Shinagawa, Tsutomu; Murase, Kuniaki; Otomo, Satomi; Katayama, Jun-ichi; Izaki, Masanobu (2009) JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 156(5): H320-H326
The temperature dependence of the refractive indices of GaN and AlN from room temperature up to 515 degrees C Watanabe, Naoki; Kimoto, Tsunenobu; Suda, Jun (2008-11-15) JOURNAL OF APPLIED PHYSICS, 104(10)
Structural and electronic characterization of (2,3(3)) bar-shaped stacking fault in 4H-SiC epitaxial layers Camarda, Massimo; Canino, Andrea; La Magna, Antonino; La Via, Francesco; Feng, G.; Kimoto, T.; Aoki, M.; Kawanowa, H. (2011-02) APPLIED PHYSICS LETTERS, 98(5)
Formation of a semi-insulating layer in n-type 4H-SiC by electron irradiation Kaneko, Hiromi; Kimoto, Tsunenobu (2011-06-27) APPLIED PHYSICS LETTERS, 98(26)
Major deep levels with the same microstructures observed in n-type 4H-SiC and 6H-SiC Sasaki, S.; Kawahara, K.; Feng, G.; Alfieri, G.; Kimoto, T. (2011-01-01) JOURNAL OF APPLIED PHYSICS, 109(1)
Temperature and injection level dependencies and impact of thermal oxidation on carrier lifetimes in p-type and n-type 4H-SiC epilayers Hayashi, T.; Asano, K.; Suda, J.; Kimoto, T. (2011-01-01) JOURNAL OF APPLIED PHYSICS, 109(1)
Impacts of reduction of deep levels and surface passivation on carrier lifetimes in p-type 4H-SiC epilayers Hayashi, T.; Asano, K.; Suda, J.; Kimoto, T. (2011-06-01) JOURNAL OF APPLIED PHYSICS, 109(11)
Nonradiative recombination at threading dislocations in 4H-SiC epilayers studied by micro-photoluminescence mapping Feng, Gan; Suda, Jun; Kimoto, Tsunenobu (2011-08-01) JOURNAL OF APPLIED PHYSICS, 110(3)