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書誌情報ファイル
Remarkable lattice recovery and low sheet resistance of phosphorus-implanted 4H-SiC (11(2)over-bar0)
  Negoro, Y; Miyamoto, N; Kimoto, T; Matsunami, H (2002-01-14)
  Applied Physics Letters, 80(2): 240-242
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Electrical activation of high-concentration aluminum implanted in 4H-SiC
  Negoro, Y; Kimoto, T; Matsunami, H; Schmid, F; Pensl, G (2004-11-01)
  Journal of Applied Physics, 96(9): 4916-4922
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Electronic behaviors of high-dose phosphorus-ion implanted 4H-SiC(0001)
  Negoro, Y; Katsumoto, K; Kimoto, T; Matsunami, H (2004-07-01)
  Journal of Applied Physics, 96(1): 224-228
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Stability of deep centers in 4H-SiC epitaxial layers during thermal annealing
  Negoro, Y; Kimoto, T; Matsunami, H (2004-09-06)
  Applied Physics Letters, 85(10): 1716-1718
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Avalanche phenomena in 4H-SiC p-n diodes fabricated by aluminum or boron implantation
  Negoro, Y; Miyamoto, N; Kimoto, T; Matsunami, H (2002-09)
  IEEE TRANSACTIONS ON ELECTRON DEVICES, 49(9): 1505-1510
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High-voltage 4H-SiC pn diodes fabricated by p-type ion implantation
  Negoro, Y; Kimoto, T; Matsunami, H (2003)
  ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS, 86(12): 44-51
Avalanche phenomena in 4H-SiC p-n diodes fabricated by aluminum or boron implantation
  Negoro, Y; Miyamoto, N; Kimoto, T; Matsunami, H (2002)
  IEEE TRANSACTIONS ON ELECTRON DEVICES, 49(9): 1505-1510
Remarkable lattice recovery and low sheet resistance of phosphorus-implanted 4H-SiC (11(2)over-bar0)
  Negoro, Y; Miyamoto, N; Kimoto, T; Matsunami, H (2002)
  APPLIED PHYSICS LETTERS, 80(2): 240-242
Flat surface after high-temperature annealing for phosphorus-ion implanted 4H-SiC (0001) using graphite cap
  Negoro, Y; Katsumoto, K; Kimoto, T; Matsunami, H (2004)
  SILICON CARBIDE AND RELATED MATERIALS 2003, PTS 1 AND 2, 457-460: 933-936
Technological aspects of ion implantation in SiC device processes
  Negoro, Y; Kimoto, T; Matsunami, H (2005)
  SILICON CARBIDE AND RELATED MATERIALS 2004, 483: 599-604